| Manufacturing Research Facilities |
| Laserline 3kW High Power Diode Laser |
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Westech 372 M CMP Tool |
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| StarDrill/Cut 150 Pulsed Nd:YAG Laser System |
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| Hembrug Super-Mikroturn CNC Turning Centre |
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| Grinding of 200mm Silicon Wafers and
other Semiconductor Substrates |
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| HURCO VM1 and VM3 Vertical Machining
Centres |
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| HAAS TL-2 CNC Machining Centre |
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GF AgieCharmilles Form 20 Die Sinking
Electro Discharge Machining System
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| Fujifilm Prescale Pressure Mapping
Film |
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| Lloyd LR30K Uniaxial Testing Machine |
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| VarioCAM hr research 780, Thermal
Imaging Camera |
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| OPTEL UG-SA 600W Ultrasonic Generator |
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| Plasma Deposition Systems |
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Variable angle ellipsometer in front of the DSE PECVD deposition system |
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| Magnetron sputtering system (Teer Coatings UDP450 system) |
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| Dow Corning atmospheric plasma system |
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| HYBRID System (hollow cathode / microwave) – PVD/PECVD coatings |
| CAP Microwave System – PECVD (including diamond film deposition) |
| Atom Beam System - neutral atom beam & magnetron system |
| Atmospheric Plasma Jet System |
| Characterisation Equipment |
| FEI Field Emission Scanning Electron
Microscope |
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| Atomic Force Micrcope |
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| Phillips Glancing Angle X Ray
Diffraction System |
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| Spectroscopic Ellipsometer |
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| DataPhysics Contact Angle measurement system- surface energy. |
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| Rockwell hardness tester |
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| Veeco Optical profilometer – surface roughness measurement |
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| Olympus metallurgical microscope &
stereo microscope. |
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| Fourier Transform Infra-Red (FTIR)
Spectroscopy |
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| Emission spectrometer – plasma diagnostics |
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| Pyrometer – temperature measurement |
| Mass spectrometer - plasma diagnostics |
Pin-on-Disk system – friction and wear tester
Scratch adhesion tester (above)
Pin-on-disc wear tester (below) |
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| Ball and cratering device – coating thickness |
| Erosive wheel tester |
| Sand abrasion system |
| Glancing angle XRD – crystalline phase identification |
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| Lenton tube furnace – thermal stability studies |
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| Microhardness tester |
| Vickers hardness tester |
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