Dual Beam FIB (DB-FIB)

Key Benefits

• Site specific cross sections and TEM sample prep
• Nano size milling and structure deposition

Capabilities

• Semiconductor failure analysis
• Identification of sub surface defects
• Thickness measurements on thin films

DB-FIB Service

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:: Select TEM DB-FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america