Energy Dispersive X-Ray (EDS or EDX)

Key Benefits

• Elemental composition of materials
• Element mapping capabilities of foreign materials
• Quick and economical
• Quantitative analysis achievable
• Excellent spatial resolution when combined with STEM

Capabilities

• Identification of foreign material on a sub micron scale
• Complementary information to SEM, WDS, CL, EBSD
• Increased spatial resolution with STEM

EDX Service

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:: Select TEM DB-FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america