Imaging

Scanning Electron Microscope's (SEM)

• FEG-SEM (Field Emission Gun- SEM) : High Resoultion
• LV-SEM (Low Vacuum SEM) : All Solid materials no coating necessary
• E-SEM (Environmental - SEM) : Only system in Ireland - WET samples

Transmission Electon Microscope's (TEM)

• 300KV FEG TEM - Coming soon!
• 200KV TEM - 0.21nm Resolution : High Resoultion
• 120KV TEM - 0.37nm Resolution : High Contrast
• Scanning - TEM (STEM) - 0.7nm Resolution : Cost Effective, Quick

Focused Ion Beam (FIB)

• Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections

Atomic Force Microscope (AFM)

Elemental Imaging

• EDX mapping : Elemental mapping
• WDS mapping : Elemental mapping

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:
Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB),  Scanning Electron Microscopy (SEM),  Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS),  Electron Backscatter Diffraction (EBSD),  Cathode-Luminescence (CL),  Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america