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Introductory Offer


Discount for all UCD Alumni


ElectronMicroscopy.ie

 

Welcome to the Nano Imaging and Material Analysis Centre (NIMAC) based in University College Dublin, Ireland, specialists in providing Scanning & Transmission Electron Microscopy (SEM, TEM) and state-of-the-art analytical techniques, training and services to industry and academia.


Capabilities

  • Scanning Electron Microscopy (SEM) - SEM Surface analysis
  • X-Ray Photoelectron Spectroscopy (XPS/ESCA) - Chemical
  • Transmission Electron Microscopy (TEM) HR-TEM Analysis
  • Dual Beam FIB (DB-FIB) - Product/ Failure analysis
  • Focused Ion Beam (FIB) - FIB provides Sub-surface information

Services

  • Electron Microscopy (Link)
  • Imaging (Link)
  • Material Analysis(Link)
  • Surface Analysis (Link)
  • FIB/TEM Cross Sections (Link)
  • Particle Analysis (Link)
  • Circuit Edits (Link)
  • Metallurgy (Link)

Electron Microscopy service, FIB service, Materials analysis, Failure analysis, Product analysis, Surface analysis, Biological Imaging, Pathology, Metallurgy, Mechanical Testing Ireland, Tensile strength, Hardness test, Optical Emission Spectrometer, Adhesion, Flexural Strength, Compressive Strength, Modulus of Rupture,Analytical Service Company, UK, Ireland, Dublin, UCD core technologies, SEM, EDX, TEM, XPS

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NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), DualBeam FIB (DB-FIB), Cryogenic Transmission Electron Microscopy (Cryo-TEM), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), X-Ray Photoelectron Spectroscopy (XPS, ESCA), Centre for Microscopy and analysis, CMA, TEM analysis, SEM Service, XPS analysis, EM service, Dublin