Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Material Analysis

Energy dispersive X-Ray (EDX)

• 1% sensitivity qualative elemental information

Wavelenght Dispersive Spectroscopy (WDS)

• 0.1% sensitivity quantative elemental information

Electron Backscatter Diffraction (EBSD)

• Site specfic crystal structure information

Variable Angle Spectroscopic Ellipsometry (VASE)

• Optical constants

X-Ray Diffraction (XRD)

• Global crystal information

Fourier Transform Infa Red (FTIR)

• Chemical information

UV-Vis Spectroscopy (UV-VIS)

• Light Absorbtion

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:
Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB),  Scanning Electron Microscopy (SEM),  Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS),  Electron Backscatter Diffraction (EBSD),  Cathode-Luminescence (CL),  Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america