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Scanning Transmission Electron Microscopy (STEM)


Key Benefits

  • High resolution images on a nanometer scale
  • Greatly increases the spatial resolution of EDX and WDS
  • Superior crystallographic information

Capabilities

  • Identification of foreign material on a nanometer scale
  • Thickness measurements on thin films
  • Crystallographic information

STEM service


STEM image

 

Services:

Techniques::

 

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america