Surface Analysis

Scanning Electron Microscope's (SEM)

• FEG-SEM (Field Emission Gun- SEM) : High Resoultion
• LV-SEM (Low Vacuum SEM) : All Solid materials no coating necessary
• E-SEM (Environmental - SEM) : Only system in Ireland - WET samples

X-Ray Photoelectron Spectroscopy (XPS / ESCA)

• Sensitivity at 0.1 At%
• Quantitative chemical information of the first 10nm atomic layers
• Oxidation state information of elements on the surface

Transmission Electon Microscope's (TEM) Interfaces of thin films

• 200KV TEM - 0.21nm Resolution : High Resoultion
• 120KV TEM - 0.4nm Resolution : High Contrast
• Scanning - TEM (STEM) - 0.7nm Resolution : Cost Effective, Quick

Focused Ion Beam (FIB)

• Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections

3D Optical Profilometry (3D-OP)

• Non contact surface profiling information

Electron Backscatter Diffraction (EBSD)

• Site specfic crystal structure information

Surface area and pore size analyser (Quantachrome)

• Surface area analysis
• Mesopore size distribution
• Standard micropore methods
• "Any Gas capability"

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:
Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), DualBeam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america