Analytical Techniques NIMAC

Analytical Services NIMAC

Submission NIMAC

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Principal Techniques

  • Scanning Electron Microscopy (SEM)
  • Focused Ion Beam (FIB)
  • X-Ray Photoelectron Spectroscopy (XPS)
  • Auger Electron Spectroscopy (AES)
  • Ultraviolet Photoelectron Spectroscopy (UPS)
  • Secondary Ion Mass Sepectrometry (SIMS)
  • Transmission Electron Microscopy (TEM)
  • Dual Beam FIB (DB-FIB)
  • Energy Dispersive Spectroscopy (EDS)

Complimentary Techniques

  • Small-angle X-ray scattering (SAXS)
  • Wavelength Dispersive Spectroscopy (WDS)
  • Electron Backscatter Diffraction (EBSD)
  • Scanning Transmission Electron Microscopy (STEM)
  • Cathode-Luminescence (CL)
  • 3D Optical Profilometry (3D-OP)

NIMAC expands 2013!

  • Advanced materials/surface characterization system including XPS/ AES/ SIMS. This system will also have depth profiling and UPS.
  • Ireland's first Cryogenic Transmission Electron Microscope (Cryo-TEM)
  • UCD's first 300KV Field Emission Gun (FEG)TEM

Metallurgy Analysis / Testing

  • Tensile strength
  • Hardness
  • Optical Emission Spectrometer
  • Adhesion
  • Flexural Strength
  • Compressive Strength
  • Modulus of Rupture

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