Transmission Electron Microscopy (TEM)

Key Benefits of TEM analysis

• Atomic resolution Transmission Electron Microscopy (TEM)
• Images on a nanometer scale
• increased spatial resolution of EDX
• Crystallographic information
• Materials & biological samples.

Capabilities in NIMAC

• Four TEM's in UCD
• Site specific TEM analysis for semiconductor failure analysis
• Cryo TEM analysis & Plunge Freezing
• DualBeam FIB sample preparation capability, the ultimate failure analysis capability.
• 3D Tomography reconstructions
• Thickness measurements on nanometer thin films
• Crystallographic information

TEM Analysis Service

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:: Select TEM DB-FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america