Training

In order to secure a place in the next training session, please fill out the following form: Training Form and return to Dr. Ian Reid in room 019 in the Engineering building.

NOTE: The user and his/her supervisor will be held responsible for any damage incurred to the Dual Beam FIB or any other system of NIMAC due to incorrect and/or careless usage of the equipment.

Prior to training all potential users are required to read the NIMAC User Guide.

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques: Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB),  Scanning Electron Microscopy (SEM),  Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS),  Electron Backscatter Diffraction (EBSD),  Cathode-Luminescence (CL),  Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america