Analytical Techniques NIMAC

Analytical Services NIMAC

Submission NIMAC

UCD Clients


Contact NIMAC


X-Ray Photoelectron Spectroscopy (XPS)

Key Benefits of XPS analysis

  • X-Ray Photoelectron Spectroscopy (XPS) sensitivity at 0.1 At%
  • Quantitative chemical information of the first 10nm atomic layers
  • Oxidation state information of elements on the surface
  • Multi sample capability
  • Advanced failure analysis capability

Capabilities in NIMAC

  • Chemical information on the first 5-10nm


XPS Analysis Service

XPS spectra

XPS Spectra 2





NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), X-Ray Photoelectron Spectroscopy (XPS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america