Circuit Edits

Focused Ion Beam (FIB) / DualBeam FIB (DB - FIB)

• On chip circuit modification
• Deposition of metal tracks
• Milling of metal tracks

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB),  Scanning Electron Microscopy (SEM),  Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS),  Electron Backscatter Diffraction (EBSD),  Cathode-Luminescence (CL),  Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:
Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis