Cross Sections

Transmission Electon Microscope's (TEM)

• 200KV TEM - 0.21nm Resolution : High Resoultion
• 120KV TEM - 0.4nm Resolution : High Contrast
• Scanning - TEM (STEM) - 0.7nm Resolution : Cost Effective, Quick

Dual Beam Focused Ion Beam (DB- FIB)

• Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections

Focused Ion Beam (FIB)

• Variable Voltage DualBeam FIB : TEM sample Prep, X-Sections

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:
Select TEM Analysis DB-FIB Analysis FIB Analysis SEM Analysis SAXS Analysis EDS Analysis WDS Analysis EBSD Analysis STEM Analysis CL Analysis Optical Profile VASE Analysis

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