Focused Ion Beam (FIB)

Key Benefits of FIB

• High resolution Focused Ion Beam (FIB) cross sections
• Quick (S)TEM sample preparation
• Circuit edits for semiconductor applications
• Failure Analysis technique
• Milling and deposition of complex structures

Capabilities

• DualBeam FIB - 5nm resolution
• Milling of cross sections up to 50 microns in depth
• Large samples accomadated

FIB Analysis Service

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:: Select TEM DB-FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america