| Principal Techniques
- Scanning Electron Microscopy (SEM)
- Focused Ion Beam (FIB)
- X-Ray Photoelectron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Secondary Ion Mass Sepectrometry (SIMS)
- Transmission Electron Microscopy (TEM)
- Dual Beam FIB (DB-FIB)
- Energy Dispersive Spectroscopy (EDS)
Complimentary Techniques
- Small-angle X-ray scattering (SAXS)
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Wavelength Dispersive Spectroscopy (WDS)
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Electron Backscatter Diffraction (EBSD)
- Scanning Transmission Electron Microscopy (STEM)
- Cathode-Luminescence (CL)
- 3D Optical Profilometry (3D-OP)
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NIMAC expands 2013!
- Advanced materials/surface characterization system including XPS/ AES/ SIMS. This system will also have depth profiling and UPS.
- Ireland's first Cryogenic Transmission Electron Microscope (Cryo-TEM)
- UCD's first 300KV Field Emission Gun (FEG)TEM
Metallurgy Analysis / Testing
- Tensile strength
- Hardness
- Optical Emission Spectrometer
- Adhesion
- Flexural Strength
- Compressive Strength
- Modulus of Rupture
t NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), DualBeam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america |