Scanning Electron Microscopy (SEM)

Key Benefits

• The most versatile Field Emission Scanning Electron Microscope (FE-SEM) available
• High Resolution images of surfaces
• Supports many other analytical techniques (FIB, STEM, EDS, WDS, EBSD, CL)
• Environmental SEM capabilities

Capabilities

• 2 Scanning Electron Microscope in house
• 1.1 nm resolution FEG SEM
• Large sample capability (6cm in diameter)
• Wide varietly of sample analysis capabilites

SEM Service

Services:
Select Electron Microscopy Imaging Material Analysis Surface Analysis Cross Sections Particle Analysis Nano Structures Circuit Edits Training

Techniques:: Select TEM DB-FIB SEM FIB STEM SAXS EDS WDS EBSD Optical Profile VASE CL

NIMAC, Scanning Transmission Electron Microscopy (STEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS, EDX), Wavelength Dispersive Spectroscopy (WDS), Dual Beam FIB (DB-FIB), Electron Backscatter Diffraction (EBSD), Cathode-Luminescence (CL), Small-angle X-ray scattering (SAXS), TEM Service, SEM Service, EM service, Electron Microscopy service, FIB service, material analysis, surface analysis, analytical service company, Europe, america